A federal jury in Chicago has found a former Philips Medical Systems engineer guilty of conspiring to steal the company’s x-ray technology trade secrets for a Chinese competitor.
Chih-Yee Jen, 71, worked at Philips’ Aurora, IL facility developing x-ray tubes for CT scanners under the company’s Dunlee brand. In 2017, as Philips prepared to close the facility, Jen began communicating with China-based Kunshan GuoLi Electronic Technology and its vice president, Xiaoqin Du, about creating a U.S. subsidiary to compete with Philips in x-ray tube development. While still employed at Philips, Jen copied proprietary technology from internal databases, shared confidential documents with Kunshan GuoLi and Du, and recruited other Philips engineers to join the subsidiary.
“The theft of proprietary information is a serious economic crime that harms American jobs and stifles critically important research and development driving the future of our nation,” said U.S. Attorney Andrew Boutros for the Northern District of Illinois, in an August 24 statement.
Jen was convicted on two counts: conspiracy to steal trade secrets and possession of stolen trade secrets. U.S. District Judge Edmond Chang set sentencing for January 5, 2027.
Two other former Philips engineers pleaded guilty prior to trial: Fince Tendian, 57, of Aurora, IL, and Vladimir Nevtonenko, 77, of Arlington Heights, IL, with their sentencing scheduled for December 8 and December 1, respectively. Du, Kunshan GuoLi, and a related Chinese company, Kunshan Yiyuan Medical Technology, have been indicted but have not been arraigned.
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